Abstract
Methods are presented for accurately measuring the temperature of
electrical components with an infrared thermal imaging system. The
methods are: (1) point and shoot: a single value of emissivity is
assigned to all pixels of a thermal image, (2) emissivity equalizaion:
an emissivity function for each pixel is calculated using an isothermal
reference image, and (3) hidden surface: a surface is covered with a
material of known emissivity. The implementation of each method is
described. Measurements and recommendations are presented concerning
the accuracy and practicality of each method.
Simulated data is presented that demonstrates the importance of
maintaining uniform ambient temperatures to insure accurate emissivity
or temperature data. A chamber used to control ambient radiation is
described. Other apparatus required for the successful implementation
of the three methods is described and evaluated.